CETAL | Infrastructure | Raman Spectroscopy

Raman Spectroscopy

Raman Spectroscopy

Contact Person: C?t?lin LUCULESCU
E-mail: catalin.luculescu@inflpr.ro
Phone: 2422



DESCRIPTION:

  • 532 nm, 633 nm si 785 nm lasers
  • Maximum resolution: 0.3 cm-1
  • Measurement range: 5-8000 cm-1
  • XYZ automatic stage with 100 nm resolution
  • Aberation-corrected Czerny-Turner monochromator (f=500 mm) System Features
  • Research-grade model assuring high spectral quality
  • Exceptional wavenumber accuracy with a high-precision rotary-encoder direct drive mechanism
  • Low wavenumber measurement
  • Auto-alignment of microscope laser introduction optics and Raman scattering light path
  • Wavenumber calibration using an integrated Ne lamp
  • Unique Dual Spatial Filter (DSF) for higher spatial resolution than conventional confocal optics
  • Patented Spatial Resolution Image (SRI) function for simultaneous observation of sample image, laser spot and aperture image

Specifications:

  • 3 lasers: 2 internal (532 nm & 785 nm), 1 external (633 nm).
  • 500 mm focal length Aberration-corrected Czerny-Turner monochrometer;
  • 3 gratings on automatic turret: 600, 1800, 2400 gr/mm;
  • Peltier cooled Andor CCD detector (high-resolution, 2048 × 512 pixel);
  • Automatic Ne lamp for wavenumber calibration;
  • Four lenses on turret: 5x, 20x, 100x microscope objectives (VIS optimalised), 100x dedicated NIR objectives available;
  • Automatic x-y-z stage with 0.1 ?m step resolution;
  • CMOS camera for sample viewing;
  • True confocal capability;
  • Simultaneous monitoring of sample view and irradiated area allows precise location of measurement point;
  • Accepts one optional dichroic mirrors for higher light throughput, recommended especially for higher laser wavelengths (785 nm);
  • Unique novel functionalities as VertiScan image distortion free illumination system;
  • SPRintS high speed imaging available as factory option;
  • Control and data handling by SpectraManager II software on Windows platform;
  • Allows display of LED illuminated sample, laser spot and spectra as well as image capturing;
  • Auto-stage control and extensive mapping functions are added;
  • Auto-Fluorescence correcting function;
  • Automatic recognition of wavenumber filter;